Review: Recent advances of ToF-SIMS for environmental analysis and imaging

Area of Science:

• Environmental Science
• Analytical Chemistry
• Surface Science

Background:

• Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful surface analysis technique.
• ToF-SIMS applications have expanded from inorganic materials to organic materials, biology, and environmental analysis.
• Its high mass resolution, accuracy, and depth profiling capabilities make it effective for environmental studies.

Purpose of the Study:

• To review the principles of ToF-SIMS.
• To highlight recent applications of ToF-SIMS in environmental research.
• To summarize sample preparation techniques for environmental applications.

Main Methods:

• Overview of ToF-SIMS principles.
• Review of ToF-SIMS applications in atmospheric aerosol, soil, water, plant, and organic solvent analysis.
• Summary of sample preparation techniques.

Main Results:

• ToF-SIMS investigations reveal surface chemical compositions, images, and depth profiles.
• Findings emphasize the role of interfacial chemistry in environmental processes.
• Mass spectral imaging provides insights into chemical transformation, particle formation, plant biology, and biotechnology.

Conclusions:

• In situ and operando imaging enable real-time study of phenomena with high spatial resolution.
• Advances in ToF-SIMS capabilities are expected to increase its use in environmental research.
• There is a growing need for chemical mapping of complex environmental analytes and systems.