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Single-channel white light interference vibration-resistant measurement method based on non-uniform fast Fourier
Optics Express
|September 23, 2025
Summary
This study introduces a novel anti-vibration method for white light interference 3D surface reconstruction. The non-uniform fast Fourier transform technique enhances vibration resistance for precise micro-nano structure measurements.
Area of Science:
- Metrology
- Optical Engineering
- Surface Science
Background:
- White light interference (WLI) is crucial for non-destructive, high-precision 3D surface reconstruction of micro-nano structures.
- WLI methods are inherently sensitive to environmental vibrations, compromising measurement accuracy.
- Existing anti-vibration techniques face limitations in complex measurement scenarios.
Purpose of the Study:
- To develop a robust, single-channel white light interference anti-vibration measurement method.
- To enhance the accuracy and reliability of 3D surface reconstruction in vibrating environments.
- To overcome the limitations of traditional WLI methods under environmental disturbances.
Main Methods:
- A novel single-channel white light interference anti-vibration measurement method utilizing non-uniform fast Fourier transform (NUFFT).
- Convolution smoothing applied to interference signals to mitigate vibration-induced noise.
- High-precision signal sampling and reconstruction, followed by centroid method integration for 3D surface restoration.
Main Results:
- The proposed NUFFT method demonstrates superior vibration resistance compared to conventional frequency-domain filtering techniques.
- Effective recovery of 3D surface information even in significantly vibrating environments.
- Consistent performance across various measurement scenarios, validating the method's versatility.
Conclusions:
- The single-channel NUFFT method offers a significant advancement in anti-vibration measurement for WLI.
- This technique provides a reliable solution for accurate 3D surface reconstruction in challenging, vibration-prone conditions.
- The method holds promise for applications requiring high-precision metrology in industrial and research settings.
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