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Super-resolution Fluorescence Microscopy

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Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been...

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Related Experiment Video

Updated: Jan 17, 2026

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

Published on: December 3, 2013

Depth extraction for shinny objects from a single-frame fringe image.

Yunqing Liu, Chenxing Wang

|September 23, 2025

Summary

This summary is machine-generated.

This study introduces a novel single-frame fringe depth measurement technique for shiny objects, overcoming limitations of traditional 3D measurement methods. The approach effectively handles specular reflections, improving accuracy for challenging surfaces.

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Last Updated: Jan 17, 2026

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

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Published on: December 3, 2013

Measuring Spatially- and Directionally-varying Light Scattering from Biological Material

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Published on: May 20, 2013

Conducting Multiple Imaging Modes with One Fluorescence Microscope

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Published on: October 28, 2018

Area of Science:

Computer Vision
3D Metrology
Optical Measurement

Background:

Fringe projection profilometry is a mature 3D measurement technique.
Specular reflection causes saturation, leading to measurement failures.
Existing solutions increase computational or hardware costs, lacking a single-frame approach.

Purpose of the Study:

To present a single-frame fringe depth measurement method for shiny objects.
To address limitations of current 3D measurement techniques in the presence of specular reflection.
To develop a computationally efficient solution for 3D measurement of reflective surfaces.

Main Methods:

Analysis of specular reflection using Lambert and Blinn-Phong models to understand oversaturation.
Construction of a ResUNet to extract normal maps and repair fringe data in saturated regions.
Development of a DCAM-MFUNet for depth prediction using complemented fringe images and normal maps.

Main Results:

Successfully extracted normal maps from fringe images.
Effectively repaired missed fringe data in saturation fields.
Achieved accurate single-frame depth measurement for shiny objects.
Demonstrated significant improvement over existing methods in extensive experiments.

Conclusions:

The proposed single-frame method effectively measures depth on shiny objects.
The technique overcomes the limitations of traditional fringe projection profilometry.
This approach offers a computationally efficient solution for 3D measurement of surfaces with specular reflection.