Electromagnetic multi-sinc Schell-model beams and their statistical characteristics

Optics Express
|September 23, 2025
PubMed

Related Concept Videos

Dual Nature of Electromagnetic (EM) Radiation01:10

Dual Nature of Electromagnetic (EM) Radiation

Electromagnetic (EM) radiation consists of electric and magnetic field components oscillating in planes perpendicular to each other and mutually perpendicular to radiation propagation through space. EM radiation can be classified as a wave, characterized by the properties of waves such as wavelength (denoted as λ) and frequency (represented by ν).
Wavelength is the distance between two consecutive peaks (the highest point) or troughs (the lowest point) in the wave. Frequency is the number of...
3.6K
Deflection of a Beam01:19

Deflection of a Beam

Accurately determining beam deflection and slope under various loading conditions in structural engineering is crucial for ensuring safety and structural integrity. Singularity functions offer a streamlined approach to analyzing beams, especially when multiple loading functions complicate the bending moment equation.
Singularity functions, described in an earlier lesson, are powerful mathematical tools that represent discontinuities within a function commonly encountered in structural loading...
684
Plane Electromagnetic Waves I01:30

Plane Electromagnetic Waves I

The existence of combined electric and magnetic fields that propagate through space as electromagnetic (EM) waves is the most significant prediction of Maxwell's equations. As Maxwell's equations hold in free space, the predicted electromagnetic waves do not require a medium for their propagation. An EM wave comprises an electric field, defined as the force per charge on a stationary charge, and a magnetic field, which is the force per charge on a moving charge.
The EM field is assumed to be a...
4.9K
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
5.3K
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
13.0K
The de Broglie Wavelength02:32

The de Broglie Wavelength

In the macroscopic world, objects that are large enough to be seen by the naked eye follow the rules of classical physics. A billiard ball moving on a table will behave like a particle; it will continue traveling in a straight line unless it collides with another ball, or it is acted on by some other force, such as friction. The ball has a well-defined position and velocity or well-defined momentum, p = mv, which is defined by mass m and velocity v at any given moment. This is the typical...
33.0K