Non-destructive optical methods for evaluating quality attributes of wheat kernels

An accurate assessment of wheat quality is crucial for minimizing economic losses and providing high-quality products to consumers. The quality determinants conventionally assessed in wheat include sprout damage, insect damage, vitreousness/hardness, and nutritional composition. Recent advancements in microstructural analysis techniques offer efficient, accurate, and non-destructive alternatives to traditional wheat kernel assessment methods that are often time-consuming, labour-intensive, and subjective. This chapter provides a comprehensive overview of optical techniques for assessing wheat quality, detailing their principles, advantages and limitations, and potential applications in wheat quality determination. Most of these methods rely on objective morphometric parameters ranging from surface examination to in-depth internal structure analysis. Among these techniques, X-ray micro-computed tomography (X-ray micro-CT) and hyperspectral imaging have demonstrated significant promise for wheat quality assessment. Additionally, advancements from other grains present opportunities to enhance existing evaluation methodologies. Adoption of these optical techniques can lead to more precise and non-destructive wheat quality control, ultimately improving product quality and reducing economic losses.