Real-Time Object Classification via Dual-Pixel Measurement

Achieving rapid and accurate object classification holds significant importance in various domains. However, conventional vision-based techniques suffer from several limitations, including high data redundancy and strong dependence on image quality. In this work, we present a high-speed, image-free object classification method based on dual-pixel measurement and normalized central moment invariants. Leveraging the complementary modulation capability of a digital micromirror device (DMD), the proposed system requires only five tailored binary illumination patterns to simultaneously extract geometric features and perform classification. The system can achieve a classification update rate of up to 4.44 kHz, offering significant improvements in both efficiency and accuracy compared to traditional image-based approaches. Numerical simulations verify the robustness of the method under similarity transformations-including translation, scaling, and rotation-while experimental validations further demonstrate reliable performance across diverse object types. This approach enables real-time, low-data throughput, and reconstruction-free classification, offering new potential for optical computing and edge intelligence applications.