Scanning Electron Microscopy
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Updated: Jan 16, 2026

Ensemble Force Spectroscopy by Shear Forces
Published on: July 26, 2022
F Javier García de Abajo1,2, Cruz I Velasco1
1ICFO-Institut de Ciencies Fotoniques, The Barcelona Institute of Science and Technology, 08860 Castelldefels, Barcelona, Spain.
We developed a novel spectrally resolved electron microscopy technique that eliminates the need for electron spectrometers. This method uses electron beam interference to probe laser-irradiated specimens, simplifying microscope design.
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