Enabling High-Throughput Perovskite FET Research by a Customizable Automated FET Measurement Station

Area of Science:

• Materials Science
• Electronics Engineering
• Chemical Engineering

Background:

• Perovskite-based thin-film field-effect transistors (PeFETs) show great promise but haven't reached their full theoretical potential.
• Optimizing perovskite compositions and fabrication methods is crucial for PeFET advancement.
• The vast number of variables necessitates a high-throughput approach for efficient research.

Purpose of the Study:

• To present a flexible, customizable, and automated process for fabricating and characterizing PeFETs.
• To enable efficient exploration and optimization of novel perovskite materials and fabrication conditions.
• To establish a systematic data pool for comparing different perovskite formulations and processing parameters.

Main Methods:

• Integration of photolithography for custom device patterning.
• Development of an automated measurement station with a multiplexer to characterize multiple devices simultaneously.
• Automated data analysis of transfer and output characteristics for key performance parameters.

Main Results:

• Automated measurement of up to 20 devices per batch, accommodating 5 different perovskite formulations.
• Generation of transfer and output characteristics, threshold voltage, subthreshold swing, and field-effect mobility.
• Creation of a systematically organized dataset for direct comparison of various perovskite compositions and fabrication conditions.

Conclusions:

• The presented automated process significantly enhances the efficiency of perovskite-based thin-film field-effect transistor research.
• This high-throughput methodology facilitates the systematic optimization of materials and fabrication techniques.
• The systematic data generation supports accelerated development and discovery in the field of PeFETs.