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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Hot carrier decay dynamics of van der Waals room temperature ferroelectric α-In2Se3
Chunlian Li1, Borong Cong1, Jiajun Cao2
1State Key Laboratory of Featured Metal Materials and Life-cycle Safety for Composite Structures, Guangxi Key Laboratory of Processing for Non-ferrous Metals and Featured Materials, and School of Resources, Environment and Materials, Guangxi University, Nanning 530004, China. wzliang@gxu.edu.cn.
Abstract:
In this study, we investigated the hot carrier decay dynamics of two-dimensional room temperature ferroelectric α-In2Se3via femtosecond transient optical spectroscopy. The photo-excited hot carriers in α-In2Se3 decay via electron-phonon coupling (τ1) and inter-layer charge transfer (τ2). We observe a change in the slope of the τ1-1-T curve near 145 K, which indicates the change in temperature-dependent phonon excitation of α-In2Se3. Below 145 K, the dephase rate τ2-1 shows an unusual temperature dependence, τ2-1 ∝ T-1, while it exhibits a linear increase with temperature above 145 K. The temperature-dependent variation of hot-carrier decay in α-In2Se3 near 145 K may be related to a hidden phase transition. The dephase rate (τ1-1) exhibits a stronger temperature dependence below 145 K than above 145 K, which may arise from the more pronounced temperature dependence of optical phonon excitation at lower temperatures.
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