X-ray Diffraction of Biological Samples
X-ray Imaging
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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Xiang Shi1,2, Yaxiang Liang2, Zhenzhong Li2,3
1Center for Advanced Material Diagnostic Technology, Shenzhen Technology University, Shenzhen 518118, China.
A new laboratory instrument uses a metal-jet X-ray source for advanced materials analysis. This versatile system provides a cost-effective alternative to synchrotron facilities for various scientific research applications.
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