A reference material for X-ray diffraction line profile analysis

Area of Science:

• Materials Science
• Crystallography
• Nanotechnology

Background:

• Nanocrystalline materials offer unique properties but require precise characterization.
• Standardized reference materials are crucial for validating advanced analytical techniques.

Purpose of the Study:

• To develop and characterize a cost-effective nanocrystalline Fe-1.8%Cr steel powder for powder diffraction.
• To evaluate its suitability as a reference material across multiple instruments and analysis methods.

Main Methods:

• High-energy planetary milling to achieve controlled nanocrystalline domain sizes.
• Characterization using multiple powder diffraction instruments (laboratory and synchrotron).
• Application of various data analysis techniques including Williamson-Hall, whole powder pattern modeling, and Rietveld refinement.

Main Results:

• Homogeneous nanocrystalline domain sizes of 10(2) nm with size dispersion of 5(1) nm.
• High dislocation density of approximately 2.90(2)×10^16 m^-2.
• Demonstrated suitability for modeling diffraction peak profiles and analyzing diffuse scattering.

Conclusions:

• The developed Fe-1.8%Cr steel powder is a stable, easy-to-handle, and cost-effective reference material.
• It is highly effective for testing and validating diverse powder diffraction data analysis methodologies.
• The material serves as a valuable tool for advancing quantitative phase analysis and materials characterization.