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Updated: Jan 15, 2026

Non-equilibrium Microwave Plasma for Efficient High Temperature Chemistry
Published on: August 1, 2017
Achieving Low-Energy fs-LIBS with a Microwave Plasma Torch: A Feasible Method for the Development of a Portable
Bingyu Wei1, Shengping Liu2, Liangyong Zhao3
1Frontiers Science Center for Rare Isotopes, State Key Laboratory of Chemistry for NBC Hazards Protection, School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China.
Abstract:
This study introduces an MPT-fs-LIBS system, combining femtosecond laser-induced breakdown spectroscopy (fs-LIBS) with a microwave plasma torch (MPT), to enhance the fs-LIBS performance under low laser pulse energy. By using femtosecond laser pulses and MPT-generated plasma, the system reduces the Cu/Zn alloys' breakdown threshold to 1 μJ and enhances the plasma emission intensity and stability. The spectral signals of Cu/Zn alloys measured via 30 μJ MPT-fs-LIBS exceed those from 1.5 mJ fs-LIBS, indicating reliable elemental detection at lower laser energies. Time-resolved spectra show that MPT enhances plasma behavior by extending its lifetime and raising electron temperature. The 30 μJ MPT-fs-LIBS creates smaller ablation craters than 1.5 mJ fs-LIBS, enabling near-nondestructive testing of industrial materials. The system demonstrates an excellent analytical performance for Al alloys. At the same laser energy, MPT-fs-LIBS has higher intensities for emission lines of Mg II 279.55 nm, Cu I 324.75 nm, Mn I 403.11 nm, and Cr I 425.42 nm than fs-LIBS. Compared to 1.5 mJ fs-LIBS, 1.5 mJ MPT-fs-LIBS reduces trace metals' (e.g., Mg) limit of detection (LOD) by 130 times, while 30 μJ MPT-fs-LIBS lowers it by 17 times. Glass sample tests suggest the method's wide applicability, with 30 μJ MPT-fs-LIBS outperforming 1.5 mJ fs-LIBS. The compact MPT-fs-LIBS avoids complex optical setups and specialized vacuum sample chambers. This method provides a practical way to integrate compact femtosecond fiber lasers with MPT, enabling portable devices for real-time multielement analysis while minimizing sample damage.
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