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Local microwave sensing of excitons and their electrical environment
Zhurun Ji1,2,3,4, Mark E Barber5,6,7,8, Ziyan Zhu8
1Department of Physics, Stanford University, Stanford, CA, USA. zhurun@stanford.edu.
Nature Communications
|October 17, 2025
Summary
We developed exciton-resonant microwave impedance microscopy (ER-MIM) to study excitons in 2D materials at low temperatures. This technique reveals exciton polarons and their interactions with the environment, enabling nanoscale electrometry.
Area of Science:
- Condensed Matter Physics
- Materials Science
- Nanotechnology
Background:
- Atomically thin transition metal dichalcogenides (TMDs) exhibit unique optical properties crucial for advanced electronics and fundamental physics.
- Studying excitonic responses at subwavelength scales presents significant challenges for conventional probing methods.
Purpose of the Study:
- To introduce and validate a novel cryogenic scanning probe technique for localized exciton analysis.
- To investigate exciton-environment interactions in monolayer MoSe2 at the nanoscale.
Main Methods:
- Development and application of exciton-resonant microwave impedance microscopy (ER-MIM) at cryogenic temperatures (1.5K).
- Measurement of excitonic responses in a monolayer MoSe2 device.
- Integration of deep learning for precise electrical parameter extraction.
Main Results:
- Identification of exciton polarons and their Rydberg states in monolayer MoSe2.
- Systematic revelation of local and nonlocal effects on excitons, including carrier density, electric fields, and dielectric screening.
- Quantified, exciton-assisted nanoscale electrometry achieved through deep learning analysis.
Conclusions:
- ER-MIM is established as a powerful optoelectronic sensing platform for probing exciton-environment interactions.
- The study provides new insights into exciton behavior in 2D materials.
- Opens avenues for exciton-based quantum control and novel device technologies.

