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Updated: Jan 13, 2026

Epitaxial Nanostructured α-Quartz Films on Silicon: From the Material to New Devices
Published on: October 6, 2020
A vibration analysis of an acoustic mass sensor structure with a c-axis tilted ZnO thin film based on silicon
Jing Liu1,2, Xiangyang Li3,4, Xiaomin Li5
1School of Information Engineering and Internet of Things, Huzhou Vocational & Technical College, Huzhou, 313000, Zhejiang, China. 2021044@huvtc.edu.cn.
Abstract:
A theoretical study was conducted on the free vibration and forced vibration behaviors of a piezoelectric bulk acoustic mass sensor featuring a c-axis tilted ZnO thin film on silicon using piezoelectric elasticity theory. The purpose is to establish the relationship between c-axis inclination angle and sensor performance. It operates in either thickness-extensional mode or thickness-shear mode. The inclination angle of the c-axis is intricately connected to the operating modes, frequency characteristics, and output admittance spectrum. Key results show: (1) Characteristic distributions of extensional and shear displacements across the thickness, and (2) Numerical simulations revealing distinct admittance spectrum patterns for different angles. Furthermore, mass-loading effects on resonant frequency shifts were quantified across different inclination angles. In conclusion, strategic control of the c-axis tilt angle enables precise optimization of resonant modes and mass sensitivity-critically motivated by the need for tunable high-sensitivity sensors in biochemical detection-providing critical design guidelines for enhanced acoustic sensors.
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