Overview of the characterization technique groups for submicroscopic structures from the micro-nano to atomic scale

Area of Science:

• Chemistry
• Materials Science
• Solid-State Physics

Background:

• Submicroscopic characterization is crucial for understanding material properties and functions.
• Establishing structure-activity relationships requires detailed analysis from micro-nano to atomic scales.

Purpose of the Study:

• To review advanced submicroscopic characterization techniques for functional solid materials.
• To organize these techniques for comprehensive reference and to advance materials discovery.

Main Methods:

• Scanning Electron Microscopy (SEM)
• Aberration-Corrected Scanning Transmission Electron Microscopy (AC-STEM)
• X-ray Diffraction (XRD)
• Energy-Dispersive X-ray Spectroscopy (EDS)
• X-ray Photoelectron Spectroscopy (XPS)
• X-ray Absorption Fine Structure (XAFS)
• Electron Energy Loss Spectroscopy (EELS)
• Nuclear Magnetic Resonance (NMR) spectroscopy
• Mössbauer spectroscopy
• Surface adsorption techniques
• In situ and operando methodologies

Main Results:

• Detailed discussion of techniques analyzing morphologies, pore structures, crystal structures, chemical compositions, oxidation states, and electronic structures.
• Integration of physical and chemical characterization aspects.
• Emphasis on tracking dynamic structural evolution during material applications.

Conclusions:

• Organized grouping of characterization technologies provides comprehensive references for researchers.
• Advances research in chemistry, materials science, and energy.
• Establishes technical foundations for discovering novel functional materials.