Method validation and uncertainty evaluation in trace element analysis of high-purity silver by ICP-OES

Area of Science:

• Analytical Chemistry
• Materials Science

Background:

• High-purity silver is vital for electronics and optics, where trace impurities critically affect performance.
• Quantifying trace elements (Cu, Pb, Fe) in silver presents analytical challenges due to matrix effects.

Purpose of the Study:

• To compare the Standard Addition Method (SAM) and Matrix-Matched External Standard Method (MMESM) for trace element quantification in high-purity silver.
• To evaluate the uncertainty associated with each quantification method.
• To discuss validation parameters including LOD, LOQ, accuracy, and precision.

Main Methods:

• Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES) was employed.
• Trace impurities (Cu, Fe, Pb) were quantified using both SAM and MMESM.
• Comprehensive uncertainty evaluations and validation parameters were assessed.

Main Results:

• Both SAM and MMESM yielded comparable and reliable quantification results for trace elements in silver.
• Both methods effectively compensated for matrix effects, demonstrating good recovery rates.
• Two-way ANOVA confirmed statistically similar results for Cu, Fe, and Pb determination by both methods.

Conclusions:

• SAM and MMESM are both suitable and reliable methods for trace element analysis in high-purity silver.
• The findings offer a comprehensive understanding applicable to trace element analysis in other metals.
• Internal standard correction showed minimal impact on the quantification results for both methods.