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Updated: Jan 12, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Ivan V Vlassiouk1, Yueh-Chun Wu2, Alexander Puretzky1
1Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA.
Generating specific defects in hexagonal boron nitride (hBN) is key for quantum devices. This study shows defect type depends on particle bombardment, offering a path for scalable quantum photonic device fabrication.
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