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Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps

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Measuring Full Counting Statistics in a Trapped-Ion Quantum Simulator.

Lata Kh Joshi¹, Filiberto Ares¹, Manoj K Joshi^2,3

¹SISSA and INFN, via Bonomea 265, 34136 Trieste, Italy.

Physical Review Letters

|October 31, 2025

Summary

This summary is machine-generated.

Researchers measured quantum fluctuations using probability distribution functions and full counting statistics in a trapped-ion quantum simulator. This method efficiently extracts detailed information about quantum observables in subsystems.

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Area of Science:

Quantum mechanics
Quantum information science
Quantum simulation

Background:

Probability distribution functions and full counting statistics are essential for characterizing quantum observable fluctuations.
These functions contain complete information about quantum fluctuations.

Purpose of the Study:

To measure probability distribution functions and full counting statistics in a trapped-ion quantum simulator.
To characterize fluctuations of transverse and longitudinal magnetization within a subsystem.

Main Methods:

Utilized a trapped-ion quantum simulator.
Employed the classical shadows toolbox for postprocessing measurements.
Performed measurements in random bases.

Main Results:

Successfully measured probability distribution functions and full counting statistics for subsystem magnetization.
Demonstrated an efficient measurement scheme for accessing these quantities.

Conclusions:

The developed measurement scheme provides efficient access to full counting statistics and probability distribution functions.
This approach is applicable to various operators and subsystems in extended quantum systems.