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Optical Trapping of Nanoparticles
Published on: January 15, 2013
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Accurate Single-Nanoparticle Sizing down to 3 nm with an Optofluidic Microcavity
Shalom Palkhivala1, Larissa Kohler1, Christian Ritschel2
1Karlsruher Institut für Technologie, Physikalisches Institut, Wolfgang-Gaede-Str. 1, Karlsruhe 76131, Germany.
ACS Nano
|November 5, 2025
Summary
We developed a new cavity-based sensing method for label-free nanoparticle detection. This technique accurately sizes single nanoparticles down to 3 nm, offering a powerful tool for advanced nanoparticle characterization.
Area of Science:
- Nanoscience and nanotechnology
- Analytical chemistry
- Physical chemistry
Background:
- Single-nanoparticle characterization is crucial for advanced applications.
- Existing label-free detection methods often lack sufficient bandwidth or quantitative data.
- There is a need for high-bandwidth, sensitive techniques for analyzing nanoparticle diffusion.
Purpose of the Study:
- To present a cavity-based dispersive sensing method for label-free single-nanoparticle detection and sizing.
- To achieve high bandwidth and sensitivity for capturing translational diffusion dynamics.
- To enable quantitative analysis of single-particle properties, including size.
Main Methods:
- Development of a cavity-based dispersive sensing platform.
- Implementation of a standing-wave sensing geometry.
- Creation of an analytical model for particle diffusion autocorrelation functions.
- Methodology to handle transient single-particle signals.
Main Results:
- Demonstration of label-free detection and sizing of single nanoparticles down to 3 nm in diameter.
- Achieved high bandwidth to capture translational diffusion time scales.
- Quantitative particle sizing with high precision and accuracy.
Conclusions:
- The developed cavity-based sensing method provides a sensitive and high-bandwidth tool for single-nanoparticle analysis.
- This technique enables quantitative sizing and diffusion analysis of nanoparticles.
- It represents a significant advancement in nanoparticle characterization.

