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Experimental characterization and analysis of an adjoint method inverse design compact edge coupler solution.
Optics Express
|November 11, 2025
Summary
We developed a compact silicon nitride edge coupler using inverse design for 1550 nm wavelength. This photonic integrated circuit component achieves low coupling loss and enables higher integration density.
Area of Science:
- Photonics
- Integrated Optics
- Materials Science
Background:
- Edge couplers are crucial for interfacing optical fibers with photonic integrated circuits.
- Traditional edge coupler designs often require a large footprint, limiting device density.
- Silicon nitride is a promising material for photonic integrated circuits due to its low loss and CMOS compatibility.
Purpose of the Study:
- To design and fabricate a compact silicon nitride edge coupler using inverse design.
- To experimentally characterize the coupling performance and loss.
- To analyze the impact of fiber alignment and fabrication variations on performance.
Main Methods:
- Utilized an open-source inverse design framework for component optimization.
- Fabricated the edge coupler using a standard 300 mm foundry lithography process.
- Measured fiber-to-chip coupling loss for quasi-TE and quasi-TM modes at 1550 nm.
Main Results:
- Achieved a compact edge coupler footprint of 12 x 4 µm.
- Measured coupling loss of 5.5 dB for the quasi-TE mode and 2.4 dB for the quasi-TM mode.
- Investigated sensitivity to fiber alignment and fabrication tolerances.
Conclusions:
- Inverse design enables significantly shorter edge couplers compared to adiabatic tapers.
- This compact design enhances integration density in photonic integrated circuits.
- The demonstrated approach is viable for high-performance photonic device fabrication.
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