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Updated: Jan 11, 2026

Fabrication and Characterization of Thickness Mode Piezoelectric Devices for Atomization and Acoustofluidics
Published on: August 5, 2020
Armando Josué Piña-Díaz1, Leonardo Castillo-Tobar2, Donatila Milachay-Montero3,4
1Departamento de Ingeniería en Control y Automatización, Escuela Superior de Ingeniería Mecánica y Eléctrica Unidad Zacatenco, Instituto Politécnico Nacional, México City 07738, Mexico.
This study introduces a novel non-contact method using optical interferometry and impedance spectroscopy to analyze piezoelectric materials like lead zirconate titanate (PZT). This frequency-mode approach offers precise characterization for advanced sensor applications.
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Published on: November 14, 2025
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