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Variable range hopping in self-encapsulated carbon features by internal resin direct laser writing carbonization
Zhufeng Jiang1,2, Guo Li2, Zhengmou Jiang1
1College of Physics and Materials Science, Changji University, Changji, 831100, People's Republic of China.
Scientific Reports
|November 13, 2025
Summary
Internal resin direct laser writing carbonization (IR-DLWc) offers improved stability for laser-induced carbon structures. This method shows higher T0 values, indicating enhanced electronic properties and long-term conductivity compared to conventional techniques.
Area of Science:
- Materials Science
- Nanotechnology
- Laser Processing
Background:
- Direct laser writing (DLW) enables micro/nanofabrication.
- Carbon materials exhibit unique electronic properties.
- Understanding conductivity stability is crucial for device longevity.
Purpose of the Study:
- Investigate temperature-dependent sheet resistance of IR-DLWc and conventional DLWc samples.
- Analyze long-term conductivity decay over four years.
- Evaluate the T0 parameter as a metric for material disorder.
Main Methods:
- Fabrication of carbon structures using IR-DLWc and conventional DLWc.
- Measurement of temperature-dependent sheet resistance.
- Application of the three-dimensional variable range hopping (3D-VRH) model.
- Long-term conductivity monitoring over 4 years.
Main Results:
- IR-DLWc samples showed significantly higher T0 values than conventional DLWc samples.
- Conventional DLWc samples exhibited rapid initial conductivity decay when exposed to air.
- IR-DLWc and UV-glue-encapsulated samples demonstrated slower initial decay but sustained faster decay rates over time.
- T0 was identified as a viable metric for characterizing disorder in IR-DLWc materials.
Conclusions:
- IR-DLWc fabrication results in carbon structures with more localized electronic states.
- The conductivity decay mechanisms in laser-induced carbon materials are complex and influenced by air interactions.
- The T0 parameter effectively quantifies structural disorder and electron transport barriers in IR-DLWc materials.

