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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
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Atomic Absorption Spectroscopy: Interference01:25

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Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
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X-ray Diffraction of Biological Samples01:10

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X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
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Atomic Emission Spectroscopy: Interference01:30

Atomic Emission Spectroscopy: Interference

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In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
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Related Experiment Video

Updated: Jan 11, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Differential interference-based measurement of 2D atomic crystal parameters.

Chengquan Mi, Xianwu Mi

    Optics Letters
    |November 14, 2025
    PubMed
    Summary

    This study introduces a novel differential interference method for accurately measuring 2D atomic crystal parameters. The technique precisely quantifies graphene layers and optical conductivity, advancing 2D material characterization.

    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Condensed Matter Physics

    Background:

    • Precise characterization of 2D atomic crystals is crucial for their technological applications.
    • Existing optical methods may lack the sensitivity required for detailed parameter extraction.
    • Understanding the optical response of 2D materials at interfaces is an active research area.

    Purpose of the Study:

    • To develop a differential interference-based method for precise measurement of 2D atomic crystal parameters.
    • To investigate the sensitivity of differential displacement to 2D material properties.
    • To demonstrate the method's capability by characterizing graphene.

    Main Methods:

    • Utilizing optical differential phenomena near the pseudo-Brewster angle.

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  • Analyzing differential interference at the air-graphene-prism interface.
  • Correlating amplified displacement with maximum coherent interference intensity.

    • Main Results:

    • Differential displacement shows distinct sensitivity to 2D atomic crystal parameters.
    • The number of graphene layers was accurately measured.
    • The optical conductivity of graphene was characterized as σ0=(5.91±0.07)×10-5Ω-1.

    Conclusions:

    • The differential interference method enables precise measurement of 2D atomic crystal parameters.
    • This technique enhances the understanding of 2D material optical properties.
    • The findings open new avenues for practical applications of 2D materials.