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Updated: Jan 11, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
A Local Structure Analysis of Defects in UiO-66: Insights from Solid-State Nuclear Magnetic Resonance and X-ray
Jiabin Xu1,2, Kun Feng2, Wanli Zhang1
1Department of Chemistry, The University of Western Ontario, London, Ontario N6A 5B7, Canada.
Defect engineering in zirconium-based metal-organic frameworks (MOFs) enhances catalytic activity. Introducing defects into UiO-66 improves the performance of integrated platinum nanoparticles for the hydrogen evolution reaction.
Area of Science:
- Materials Science
- Catalysis
- Nanotechnology
Background:
- Defect engineering in metal-organic frameworks (MOFs) is a key strategy for tuning material properties.
- Zirconium-based MOFs, such as UiO-66, are promising materials for various applications.
- Controlled introduction of defects can significantly alter MOF functionality.
Purpose of the Study:
- To characterize the atomic-level local structures of defects in UiO-66 MOFs.
- To investigate the impact of engineered defects on the catalytic performance of integrated platinum nanoparticles (Pt NPs).
- To explore the potential of defective UiO-66 as a support for enhanced catalysis.
Main Methods:
- Utilized multinuclear solid-state NMR spectroscopy (SSNMR) and X-ray absorption fine structure (XAFS) for defect characterization.
- Performed in situ heating XAFS analyses at the Zr K-edge to monitor structural changes.
- Employed various multinuclear SSNMR techniques (¹H, ¹³C, ¹⁹F, ³⁵/³⁷Cl, ¹⁷O) to identify defect-associated species.
Main Results:
- In situ XAFS revealed changes in Zr local structure, including decreased Zr-O coordination and altered Zr-Zr distances upon trifluoroacetic acid (TFA) removal.
- SSNMR identified capping and defect-associated species within the MOF structure.
- Defect-engineered Pt-UiO-66 exhibited significantly enhanced hydrogen evolution reaction (HER) activity and stability compared to non-defective counterparts.
Conclusions:
- Atomic-level characterization of defects in UiO-66 is achievable using a combination of SSNMR and XAFS.
- Engineered defects in UiO-66 effectively improve the catalytic performance of integrated Pt NPs.
- Defective UiO-66 shows great promise as an advanced catalytic support material for reactions like HER.
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