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Updated: Jan 11, 2026

Sputter Growth and Characterization of Metamagnetic B2-ordered FeRh Epilayers
Published on: October 5, 2013
Microthermoreflectance Characterization of the Band-Structure Transformations Observed During the Magnetic-Ordering
Ching-Hwa Ho1,2, Yen-Chang Su1, Yu-Hung Peng1
1Graduate Institute of Applied Science and Technology National Taiwan University of Science and Technology Taipei 106 Taiwan.
Abstract:
2D layered ferromagnetic (FM) materials hold significant promise for various applications owing to their hysteretic behavior and the ultrathin magnetic-ordering control of spin electrons below the Curie temperature (TC). The spin-polarized order in the FM zone (e.g., T ≤ TC = 225 K for Fe3GeTe2), paramagnetic (PM) zone (e.g., T > TC), and low-temperature anisotropic (AI) zone (e.g., T < 75 K < TC for Fe3GeTe2) are typically characterized by observing changes in the magnetization and magnetoresistance under the application of an external magnetic (electric) field. However, observing the near-band-edge transitions across the FM, PM, and AI regions of a layered magnetic metal is challenging utilizing optical spectroscopy due to its high surface carrier density for shielding incident lights. In this study, three interband transitions, designated as A1, A2, and A3, are measured and identified through temperature-dependent microthermoreflectance (μTR) measurements of multilayered Fe3GeTe2 metal across a temperature range of 20-300 K, enabling the distinction of the FM, PM, and AI zones using optical methods. The A1 transition (≈1.73 eV) is detected across the entire temperature range of 20-300 K, whereas the A2 transition (≈1.95 eV) appears only in the AI zone below 75 K, and the A3 transition (≈2.23 eV) is observed only in the FM phase below TC (≈225 K). Density functional theory calculations suggest that all transitions (A1-A3) originate from the down-spin-polarized band of Fe 3d electrons. Moreover, temperature-dependent X-ray diffraction, Raman, magnetization, and magneto-resistivity measurements are performed to confirm the TC and AI temperatures observed for multilayered FGT by μTR.
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