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Updated: Apr 13, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Conformal Encapsulation of Wafer-Scale Molybdenum Disulfide Field-Effect Transistors by Plasma-Induced Molecular
Ming-Jin Liu1, Yong Wang2, Ruei-Hong Cyu1
1Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu, 30013, Taiwan.
Abstract:
Molecular engineering of 2D transition-metal dichalcogenides (TMDs) is an effective strategy for tuning their electronic properties, enhancing metal-semiconductor contacts, and modulating charge carrier dynamics. However, scalable molecular engineering for fabricating wafer-scale 2D TMDs field-effect transistors (FETs) has been scarcely reported. Here, improved electrical performance in monolayer (1L)-MoS2 FETs via allylamine polymer encapsulation, achieved by a plasma-induced molecule polymerization (PIMP) process with a low power of 5 W, is reported. Electrical measurement results confirm a weak n-doping effect in 1L-MoS2, with which the doping concentrations could be adjusted from 1.12 × 1012 to 5.17 × 1012 cm-2. A high-resolution transmission electron microscopy (HRTEM) image reveals an ultra-thin and dense allylamine polymer layer with a thickness of 3.7 nm, uniformly coated on the surface of the 1L-MoS2 under the PIMP process for 20 s. The conformal polymerized layer not only reduces the hysteresis loops of the 1L-MoS2 FETs but also enhances environmental stability while preserving the transistor characteristics for ≈9 months. Additionally, 1L-MoS2 FET arrays with over 5000 devices on a large scale, revealing high uniformity and reproducibility using the PIMP process, which offers a practical and scalable strategy for wafer-scale optimization of 2D FETs, are demonstrated.
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