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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Seungmin Han1, Hyunjeong Kwak1, Jungho Lee2
1Department of Electrical Engineering, Pohang University of Science and Technology, Pohang, 37673, Republic of Korea.
A new double-layer ECRAM (IRIS-ECRAM) visualizes oxygen vacancy migration, revealing opposing switching behaviors and enabling device optimization for neuromorphic computing and analog in-memory applications.
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