A multi-model deep learning framework for SEM-based defect detection in [Formula: see text] Perovskite thin films

Zulfikar Ali Ansari1, Sahil Soni2, Shahin Fatima3

  • 1AIML Department, Symbiosis Institute of Technology, Symbiosis International (Deemed University), Lavale, Pune, Maharashtra, 412115, India. zulfikar.ansari@sitpune.edu.in.

Scientific Reports
|November 25, 2025
PubMed