Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Association between vitamin D levels and psychological stress-induced asthma prevalence: an untargeted metabolomics study combined with the NHANES database.

Frontiers in nutrition·2026

Same author

Effect of Y Content on Precipitation Behavior, Oxidation and Mechanical Properties of As-Cast High-Temperature Titanium Alloys.

Materials (Basel, Switzerland)·2023

Same author

Influence of Gut Microbiota on Metabolism of Bisphenol A, a Major Component of Polycarbonate Plastics.

Toxics·2023

Same author

Elevated CEA and CA 19-9 Levels within the Normal Ranges Increase the Likelihood of CRC Recurrence in the Chinese Han Population.

Applied bionics and biomechanics·2022

Same author

One-Step Fabrication of a Functionally Integrated Device Based on Polydimethylsiloxane-Coated SiO<sub>2</sub> NPs for Efficient and Continuous Oil Absorption.

Materials (Basel, Switzerland)·2021

Same author

An injectable recombinant human milk fat globule-epidermal growth factor 8-loaded copolymer system for spinal cord injury reduces inflammation through NF-κB and neuronal cell death.

Cytotherapy·2020

Search research articles

Related Experiment Video

Updated: Jan 10, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Multifrequency AFM integrating PeakForce tapping and higher eigenmodes for heterogeneous surface characterization.

Yanping Wei¹, Jiafeng Shen¹, Yirong Yao¹

¹Public Technology Center, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China.

Beilstein Journal of Nanotechnology

|November 26, 2025

Summary

This summary is machine-generated.

This study presents a new multifrequency atomic force microscopy (AFM) method. It combines PeakForce tapping with higher eigenmode vibrations for enhanced topographical and compositional imaging of nanomaterials.

Keywords:

atomic force microscopy (AFM)high eigenmodes multifrequency AFM nanoscale material analysis surface characterization

More Related Videos

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

Related Experiment Videos

Last Updated: Jan 10, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays

Published on: June 13, 2023

Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Multimodal atomic force microscopy (AFM) is crucial for nanoscale characterization.
Distinguishing material compositions in heterogeneous nanomaterials often requires complex AFM setups and probe selection.

Purpose of the Study:

To develop a simplified multifrequency AFM technique integrating PeakForce tapping with higher eigenmode vibrations.
To achieve simultaneous high-resolution topographical imaging and material composition differentiation.

Main Methods:

Employed non-resonant and higher eigenmode frequencies in conjunction with PeakForce tapping mode.
Applied higher eigenmode vibrations at low amplitudes to avoid interference with topographical and nanomechanical mapping.

Main Results:

Successfully achieved simultaneous high-resolution topographical imaging and compositional mapping.
Demonstrated that low-amplitude higher eigenmode vibrations do not significantly disrupt standard PeakForce tapping measurements.
Showcased effective compositional differentiation in heterogeneous nanomaterials.

Conclusions:

The novel multifrequency AFM technique simplifies probe selection for material differentiation.
This integrated approach enhances practicality and broadens probe compatibility for advanced nanomaterial analysis.