Surface Charge-Induced Scattering Enhancement of Diverse Dielectric Nanoscale Particles: A Simulation Study

At the nanoscale, the scattered light intensity of particles significantly decreases and is easily affected by surface charges. However, under certain conditions, surface charges can induce a scattering enhancement effect, providing a new solution for the precise measurement of nanoparticles. Nevertheless, the universality of this effect in different material systems is still unclear. Therefore, we selected eight typical submicron dielectric particles encompassing oxides, polymers, semiconductors, and ceramics. Their optical responses under surface charging conditions were studied through numerical simulation. Results show that surface charges induce changes in the complex refractive index and significantly increase the scattering coefficient across all these particle types, compared to their neutral states. This enhancement effect is pronounced at the nanoscale particles, while at the submicron scale there is a clear critical size threshold, beyond which the enhancement effect significantly weakens. Surface charges also cause a spatial redistribution of scattered light intensity, enhancing the strength of forward, backward, and side scattering. These results confirm the cross-material universality of the surface charge-induced scattering enhancement effect. Our study provides a theoretical basis for extending optical measurement techniques for nanoscale particles and suggests considering surface charges in their detection and characterization to improve sensitivity and accuracy.