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High-sensitivity dynamic detection by tapping-mode nanomechanical sensing using an all-fiber microcantilever probe
Optics Letters
|December 1, 2025
Summary
This study introduces a novel dynamic microforce sensor using a fiber-optic microcantilever for atomic force microscopy (AFM). It achieves pN-level force detection, enabling precise microscale material characterization.
Area of Science:
- Microscale material characterization
- Nanotechnology
- Sensor development
Background:
- Precise microscale material characterization is crucial for advancements in various scientific fields.
- Existing sensor technologies often face limitations in sensitivity and resolution for microscale applications.
Purpose of the Study:
- To develop and characterize a novel dynamic microforce sensor.
- To integrate a fiber-optic microcantilever probe for tapping-mode atomic force microscopy (AFM).
Main Methods:
- Femtosecond laser two-photon polymerization (TPP) nanolithography to fabricate microstructure cantilever beam probes on fiber end faces.
- Finite element analysis (FEA) for determining dynamic mechanical properties and optimizing the microcantilever structure.
- Parametric modeling for sensor optimization.
Main Results:
- Achieved a microforce sensitivity of 103 Hz/nm.
- Obtained a quality factor (Q) of 326.98.
- Demonstrated a pN-level force detection limit, approximately 17 pN.
Conclusions:
- The developed dynamic microforce sensor offers high sensitivity and a low detection limit for microscale force measurements.
- Its simple structure and parallel probe configuration make it highly promising for applications in quantitative analysis of soft materials and biological samples.
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