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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Quantitative Hardness Measurement by Instrumented AFM-indentation

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Published on: November 22, 2016

Standardizing Force Reconstruction in Dynamic Atomic Force Microscopy.

Simon Laflamme¹, Bugrahan Guner¹, Omur E Dagdeviren¹

¹Department of Mechanical Engineering, École de technologie supérieure, University of Quebec, Montreal, Quebec, Canada, H3C 1K3.

The Journal of Physical Chemistry Letters

|December 4, 2025

Summary

This summary is machine-generated.

This study evaluates atomic force microscopy (AFM) force reconstruction methods, introducing software to improve consistency and reproducibility in nanoscale measurements for materials science and biophysics.

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Area of Science:

Nanotechnology
Materials Science
Biophysics

Background:

Atomic force microscopy (AFM) is crucial for nanoscale analysis.
Dynamic AFM modes require mathematical reconstruction of interaction forces from measured observables.
Inconsistent application of reconstruction methods hinders reproducibility.

Purpose of the Study:

To systematically evaluate major force reconstruction methods in AFM.
To detail theoretical foundations, performance regimes, and error sources for these methods.
To introduce an open-source software package for benchmarking and comparison.

Main Methods:

Evaluation of major force reconstruction techniques in frequency- and amplitude-modulation AFM.
Systematic analysis of theoretical underpinnings and error sources.
Development and implementation of a unified, open-source software package.

Main Results:

Comprehensive comparison of different AFM force reconstruction algorithms.
Identification of performance limitations and sources of error for each method.
A unified software package enabling direct, side-by-side method comparison.

Conclusions:

The developed software promotes consistent and interpretable AFM force spectroscopy.
Standardized evaluation is critical for reliable nanoscale measurements.
This work facilitates broader and more dependable AFM applications across scientific disciplines.