Development and validation of an interface for automated image acquisition during high-temperature environmental

J Lautru1, R Podor1

  • 1ICSM, CEA, CNRS, ENSCM, Univ Montpellier, Marcoule, France.

Micron (Oxford, England : 1993)
|December 7, 2025
PubMed
Summary

A new automated interface for environmental scanning electron microscopy (ESEM) streamlines high-temperature experiments. This system enhances image acquisition across multiple sample areas and magnifications, improving material analysis efficiency.