Sample Preparation for Analysis: Advanced Techniques
Sample Preparation for Analysis: Overview
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Updated: Jan 9, 2026

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
Published on: September 13, 2020
Chuqi Shi1, Yanfang Pan1, Qin Yang1
1Institute of Materials Research, Tsinghua Shenzhen International Graduate School, Tsinghua University, Shenzhen, China.
Proper sample preparation and parameter optimization are crucial for accurate results using Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). This guide details methods for reliable surface analysis and data acquisition.
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