Genome-Wide Association Study Using High-Density SNP Chip Markers Revealed Novel Bacterial Panicle Blight

Seong-Gyu Jang1, Sumin Jo1, Sais-Beul Lee1

  • 1National Institute of Crop Science, Miryang 50424, Korea.

The Plant Pathology Journal
|December 10, 2025
PubMed
Abstract