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Enhancing the Resolution Utilization for DIC Measurement of Slender Components Using Shear Imaging.
Yinhang Ma1, Kangjiang Lv1, Zhuoxuan Song1
1School of Mechanical and Electronic Engineering, Nanjing Forestry University, Nanjing 210037, China.
Sensors (Basel, Switzerland)
|December 11, 2025
Summary
A new virtual multi-camera digital image correlation (DIC) method uses Michelson shear devices to improve resolution utilization for slender components. This cost-effective approach enables high-resolution deformation measurement without extra cameras.
Area of Science:
- Mechanical Engineering
- Optical Measurement Techniques
- Materials Science
Background:
- Digital image correlation (DIC) is a key technique for full-field deformation measurement.
- Slender components often underutilize DIC's spatial resolution due to their high aspect ratio.
- Existing methods may require complex setups or additional cameras for high-resolution measurements.
Purpose of the Study:
- To propose a novel virtual multi-camera DIC method for enhanced resolution utilization in slender component measurement.
- To improve the cost-effectiveness and practicality of DIC systems in constrained environments.
- To enable high-resolution full-field morphology and deformation measurements of slender components.
Main Methods:
- Integration of a conventional dual-camera setup with two Michelson shear devices (MSDs).
- Each MSD splits the component's image, projecting segments onto the same sensor to enhance resolution.
- System calibration to establish extrinsic parameters for stitching 3D data from different regions.
Main Results:
- Successful experimental validation using translation and bending tests.
- Accurate full-field morphology and deformation measurements achieved.
- Sub-pixel level agreement demonstrated in overlapping measurement regions.
Conclusions:
- The proposed virtual multi-camera DIC method effectively enhances resolution utilization for slender components.
- This approach provides a practical and cost-effective solution for high-resolution DIC measurements.
- The method overcomes limitations of conventional DIC in measuring high-aspect-ratio structures.
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