First-Principles insights into group-V impurities and their impact on germanium detector performance.
Sandip Aryal1, Enrique R Batista2, Gaoxue Wang3
1Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM, 87545, USA. saryal@lanl.gov.
Scientific Reports
|December 11, 2025
Summary
Point defects and impurities in high-purity germanium (HPGe) detectors degrade performance by trapping charge carriers. Group-V impurities and their complexes with vacancies create deep traps, impacting detector resolution.
Area of Science:
- Materials Science
- Nuclear Physics
- Computational Physics
Background:
- High-purity germanium (HPGe) detectors are crucial for nuclear physics research, offering excellent energy resolution and sensitivity.
- Defects and impurities in HPGe crystals cause charge trapping, degrading detector performance and energy resolution.
Purpose of the Study:
- To investigate the energetics of point defects in germanium (Ge) using density functional theory.
- To understand the impact of group-V impurities and their complexes with vacancies on charge trapping in HPGe detectors.
Main Methods:
- Density functional theory (DFT) calculations with hybrid functionals were employed.
- The study focused on the formation energies and electronic properties of point defects in Ge.
Main Results:
- Group-V impurities (P, As, Sb) are more likely to form in Ge than vacancies or interstitials.
- Nitrogen (N) creates deep trap states, while P, As, and Sb form shallow traps near the conduction band edge.
- Group-V defects can form complexes with Ge vacancies, creating deep traps that contribute to charge trapping.
Conclusions:
- Both Ge vacancies and vacancy-impurity complexes are significant contributors to charge trapping in HPGe detectors.
- Understanding these defects is crucial for improving the performance and reliability of HPGe detectors for sensitive nuclear measurements.
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