Dopant Site Occupancy Determined by Core-Loss-Filtered, Position-Averaged Convergent Beam Electron Diffraction

Michael Deimetry1, Timothy C Petersen2, Matthew Weyland2,3

  • 1School of Physics and Astronomy, Monash University, Clayton, Victoria 3800, Australia.

Summary

Core-loss-filtered convergent beam electron diffraction patterns can quantify dopant site occupancy in crystals. This advanced electron microscopy technique offers a new method for materials analysis.

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