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Demonstration of time-resolved Fe K-edge XANES with a self-seeded X-ray free-electron laser at PAL-XFEL

Rory Ma1,2, Yujin Kim1, Inhyuk Nam3

  • 1Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang, 37673, South Korea.

Scientific Reports
|December 16, 2025
PubMed
Abstract

No abstract available in PubMed .

Keywords:
Self-seedingTime-resolved XANESTime-resolved spectroscopyTransition metal complexesUltrafast X-ray absorption spectroscopyX-ray free electron laser

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Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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