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Mapping defect distribution in transparent single-walled carbon nanotube film with electrical resistance tomography

Keiya Minakawa1, Taiki Nakada1, Reiji Kaneko1

  • 1Department of Applied Electronics, Graduate School of Advanced Engineering, Tokyo University of Science, Katsushika, Tokyo, 125-8585, Japan.

Scientific Reports
|December 18, 2025
PubMed
Abstract

No abstract available in PubMed .

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