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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
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Absolute distance measurement with extended range and rate based on frequency scanning interferometry with a
Optics Express
|December 19, 2025
Summary
A novel frequency scanning interferometry (FSI) system uses a passive Fabry-Pérot (FP) delay line to enable high-speed, long-range distance metrology. This innovation overcomes bandwidth limitations, allowing precise measurements with lower data processing needs.
Area of Science:
- Optical Metrology
- Precision Engineering
Background:
- Conventional frequency scanning interferometry (FSI) faces bandwidth limitations for high-speed, long-range distance measurements.
- Existing FSI systems often require high acquisition rates and complex active switching mechanisms.
Purpose of the Study:
- To introduce a novel FSI system integrated with a passive Fabry-Pérot (FP) delay line.
- To overcome bandwidth limitations in high-speed, long-range distance metrology.
- To enable precise range estimation using low-bandwidth detectors and signal processing.
Main Methods:
- The system utilizes multiple optical delays within a single FP cavity to generate a comb of modulation frequencies.
- A dual-cavity configuration resolves delay order ambiguity.
- A swept VCSEL laser with a 100 kHz repetition rate and 100 nm bandwidth was employed.
Main Results:
- Demonstrated absolute range measurements up to 1.4 meters with sub-3 ppm precision.
- Achieved a maximum sampling rate over 67 times lower than conventional FSI systems for the same range and repetition rate.
- Showcased a significant reduction in computational effort compared to traditional FSI.
Conclusions:
- The developed FSI system effectively overcomes bandwidth limitations for distance metrology.
- The system offers a cost-effective, compact, and scalable solution for dynamic industrial environments.
- It is compatible with standard fiber components, paving the way for real-time metrology applications.
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