Interference between One- and Two-Electron Channels in Resonant Inelastic X-Ray Scattering
Johan Söderström1, Marcus Agåker1,2, Ji-Cai Liu3,4
1Uppsala University, Department of Physics and Astronomy, Box 516, 751 20 Uppsala, Sweden.
Physical Review Letters
|December 19, 2025
Summary
Interference between scattering channels was observed in resonant inelastic x-ray scattering (RIXS) at the Ne K threshold. This interference creates an asymmetric line profile, well-modeled by a single parameter.
Area of Science:
- Atomic Physics
- X-ray Spectroscopy
- Quantum Mechanics
Background:
- Resonant inelastic x-ray scattering (RIXS) probes electronic structure.
- Understanding interference effects is crucial for interpreting RIXS spectra.
Purpose of the Study:
- To investigate interference between scattering channels in RIXS at the Ne K threshold.
- To analyze the formation of asymmetric line profiles in RIXS spectra.
Main Methods:
- Experimental RIXS measurements at the Ne K threshold.
- Theoretical modeling of scattering channel interference.
- Analysis of spectral line profiles using the Fano effect model.
Main Results:
- Observed interference between one-electron and two-electron scattering channels.
- Identified asymmetric line profiles in RIXS spectra due to this interference.
- Demonstrated that the asymmetric profile can be accurately modeled by a single asymmetry parameter.
Conclusions:
- Interference between scattering channels significantly impacts RIXS spectra.
- The Fano effect provides a suitable framework for understanding these interference phenomena.
- The asymmetry parameter effectively characterizes the observed spectral profiles.
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