Tip-Scan High-Speed Atomic Force Microscopy in Organic Solvent: A Versatile Tool for Visualizing Dynamic Behaviors of

Honami Matsui1, Christian Ganser2, Kenta Tamaki3

  • 1Department of Applied Physics, The University of Osaka, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.

Summary

High-speed atomic force microscopy (HS-AFM) now works in organic solvents. A new glass cell enables tip-scan HS-AFM to observe nanoscale dynamics of supramolecular assemblies and polymers in their native environments.