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Updated: Jan 7, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Tip-Scan High-Speed Atomic Force Microscopy in Organic Solvent: A Versatile Tool for Visualizing Dynamic Behaviors of
Honami Matsui1, Christian Ganser2, Kenta Tamaki3
1Department of Applied Physics, The University of Osaka, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan.
None:
High-speed atomic force microscopy (HS-AFM) is a powerful tool for video recording the nanoscale dynamics of samples. Its applications have recently expanded to various fields from biology to chemistry, including supramolecular chemistry and polymer science. Furthermore, the development of a stand-alone tip-scan HS-AFM has offered greater flexibility in installation. As it can be mounted on an optical microscope for integration with optical techniques, it holds great promise for supramolecular chemistry and polymer science. However, tip-scan HS-AFM observations in organic solvents have been challenging due to difficulties in holding them with low surface tension. In this study, we achieved tip-scan HS-AFM observations in organic solvents by developing a glass cell. The cell was carefully designed to be compatible with tip-scan HS-AFM operation in organic solvents. Using the cell, we successfully demonstrated tip-scan HS-AFM observations of supramolecular assemblies in various organic systems. In addition, the large and stable design of the cell allowed for a wider variety of organic solvents than the small wells used in conventional HS-AFM. Tip-scan HS-AFM compatible with organic solvents will contribute to investigating the complex dynamics of supramolecular assemblies and polymers in their native organic environments.
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