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Updated: Jan 8, 2026

Determining the Mechanical Strength of Ultra-Fine-Grained Metals
Published on: November 22, 2021
Yimeng Li1, Linghan Xia1, Nan Li1
1State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, China.
Electric fields cause damage in nanodevices. Tungsten nanotips deform via field-assisted evaporation at lower thresholds than previously thought, impacting nanoelectronic device reliability.
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