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Published on: April 26, 2014
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Ranging beyond synthetic wavelengths with an undersampled spectral signal using tunable wavelength laser
Optics Letters
|December 24, 2025
Summary
This study demonstrates precise centimeter-scale ranging and micrometer-level profile resolution by extending measurement range beyond synthetic wavelength limits using continuous wavelength tuning and tilted interference. This method enables unique extended range measurements and sample profiling.
Area of Science:
- Optical Metrology
- Interferometry
- Signal Processing
Background:
- Accurate ranging and surface profiling are crucial in various scientific and industrial applications.
- Traditional methods face limitations in range and resolution, particularly with spectrally undersampled signals.
Purpose of the Study:
- To develop a novel method for extending measurement range beyond the synthetic wavelength limit.
- To achieve precise centimeter-scale ranging and micrometer-level profile resolution.
- To enable unique extended range measurements and sample profiling from a single wavelength scan.
Main Methods:
- Continuous tuning of the source wavelength.
- Utilizing tilted interference for excess fraction extraction from spectrally undersampled signals.
- Employing a cascaded Michelson interferometer and Fourier transform method for fringe analysis.
Main Results:
- Achieved range extension beyond the longest synthetic wavelength.
- Demonstrated unique measurement of the extended range and spatial sample profile.
- Obtained centimeter-scale ranging with sub-nanometer wavelength tuning resolution.
- Achieved micrometer-level profile resolution.
Conclusions:
- Continuous wavelength tuning combined with tilted interference enables precise extended range measurements.
- The cascaded Michelson interferometer offers a robust platform for simultaneous ranging and profiling.
- This technique significantly enhances capabilities in optical metrology for high-precision applications.
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