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Updated: Jan 7, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Bazlul Karim1, Luka Pirker1, Jan Plšek1
1J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Dolejškova 2155/3, 182 23 Prague 8, Czech Republic.
Directly exfoliating molybdenum disulfide (MoS2) onto reactive titanium (Ti) causes degradation. Thicker MoS2 layers offer improved stability, suggesting potential for engineering contacts with reactive metals.
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