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Seeing without touching: weak-disturbance imaging and characterization of ultra-confined optical near fields
Bowen Wang1,2,3, Qian Chen2,3, Chao Zuo4,5,6
1Smart Computational Imaging Laboratory (SCILab), School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, Jiangsu Province, 210094, China.
Abstract:
A recent study employing high-spatial-resolution photoemission electron microscopy (PEEM) achieved, for the first time, weak-disturbance imaging of the ultra-confined nanoslit mode in a coupled nanowire pair (CNP), revealing its quasi-three-dimensional field distribution.
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