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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jan 13, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

Quantitative estimation of nanoparticle/substrate adhesion by atomic force microscopy.

Aydan Çiçek¹, Markus Kratzer², Christian Teichert²

¹Department of Materials Science, Montanuniversität Leoben, Franz-Josef-Straße 18, 8700 Leoben, Austria.

Beilstein Journal of Nanotechnology

|January 7, 2026

Summary

This summary is machine-generated.

This study reveals optimal copper nanoparticle adhesion to silicon substrates occurs for particles 6-12 nm in size. Increased adhesion forces were also observed with applied positive substrate bias voltage.

Keywords:

adhesion atomic force microscopy magnetron sputtering nanomanipulation nanoparticles

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Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Nanoparticle adhesion to substrates is critical for applications in energy, nanofabrication, catalysis, and electronics.
Understanding and controlling these interactions is essential for optimizing device performance and stability.

Purpose of the Study:

To develop and apply a methodology for quantifying the adhesion forces of copper nanoparticles on silicon substrates.
To investigate the influence of nanoparticle size and substrate bias voltage on adhesion.

Main Methods:

Copper nanoparticles were deposited onto silicon substrates using DC magnetron sputter inert gas condensation.
Atomic Force Microscopy (AFM) was employed for nanoparticle manipulation and lateral force measurement.
Cantilever calibration was performed using wedge and diamagnetic lateral force calibrator methods.

Main Results:

Work of adhesion was determined by integrating lateral forces during nanoparticle displacement.
A non-monotonic size dependency was observed, with maximum adhesion for nanoparticles between 6 and 12 nm.
A positive substrate bias voltage increased nanoparticle adhesion forces due to more energetic landing conditions.

Conclusions:

Atomic Force Microscopy is a suitable technique for nanoscale adhesion characterization.
Nanoparticle size and substrate bias are key parameters for tailoring nanoparticle-substrate interactions.
Findings provide insights for optimizing nanoparticle integration in various technological applications.