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  1. Home
  3. Mid-infrared Optical Photothermal Interferometric Microscopy Of Substrate-supported Samples.
  1. Home
  3. Mid-infrared Optical Photothermal Interferometric Microscopy Of Substrate-supported Samples.

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Mid-Infrared Optical Photothermal Interferometric Microscopy of Substrate-Supported Samples.

Caitlin E Dunlap1, Alexander J Higgins1, Alexandria Alailima Martin1

  • 1Department of Chemistry, Purdue University, West Lafayette, Indiana 47907, United States.

Analytical Chemistry
|January 8, 2026

View abstract on PubMed

Summary
This summary is machine-generated.

A new interferometry model simplifies optical photothermal mid-infrared (O-PTIR) microscopy analysis for thin films. This approach enhances signal-to-noise ratios and enables precise thickness measurements of biological samples like Synechocystis colonies.

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Area of Science:

  • Microscopy
  • Spectroscopy
  • Optical Physics

Background:

  • Existing scattering-based models for optical photothermal mid-infrared (O-PTIR) microscopy are computationally complex for non-spherical samples.
  • Accurate interpretation of image contrast in O-PTIR microscopy requires advanced theoretical frameworks.

Purpose of the Study:

  • To propose and experimentally validate an interferometry model for O-PTIR microscopy.
  • To develop a computationally tractable model for analyzing thin-film samples on substrates.
  • To enhance signal-to-noise ratios and information content in O-PTIR measurements.

Main Methods:

  • Development of a thin-film interferometry model for O-PTIR microscopy.
  • Experimental evaluation of the model using localized, transient heat deposition.
  • Analysis of both time-averaged (DC) and photothermally induced (AC) reflectivity changes.
  • Comparison of measurements on silicon and calcium fluoride substrates.

    • Main Results:

    • The proposed optical photothermal interferometry analysis (OPTIA) model accurately interprets O-PTIR measurements.
    • Absolute thickness of individual Synechocystis colonies was recovered.
    • Significant signal-to-noise enhancements were observed on silicon substrates due to interference effects.
    • The model predicted and confirmed enhanced contributions from optical interference.

    Conclusions:

    • The OPTIA model provides a robust method for analyzing O-PTIR data from substrate-supported samples.
    • Interference effects can be leveraged to significantly improve O-PTIR measurement sensitivity and information yield.
    • This work lays the groundwork for new O-PTIR measurement strategies exploiting native interferometry.